scanasm.exp doesn't work too well

[Jakub Jelinek]

On Thu, Jun 13, 2002 at 12:55:19PM -0700, H . J . Lu wrote:
> Your patch:
> 
> 2002-06-10  Jakub Jelinek  <jakub@redhat.com>
> 
> 	* g++.dg/opt/vt1.C: New test.
> 
> causes:
> 
> FAIL: g++.dg/opt/vt1.C scan-assembler-not section.*_ZTV1S.*"[^w"]*"
> 
> The problem is the asm output is
> 
> ...
>         .section        .gnu.linkonce.d._ZTV1S,"aw",@progbits
> ...
>         .section        .gnu.linkonce.t._ZN1S2vmEv,"ax",@progbits
> 
> But scan-assembler-not does
> 
>     set fd [open $output_file r]
>     set text [read $fd]
>     close $fd
> 
>     if ![regexp -- "[lindex $args 0]" $text] {
>         pass "$testcase scan-assembler-not [lindex $args 0]"
>     } else {
>         fail "$testcase scan-assembler-not [lindex $args 0]"
>         verbose -log "$testcase: $text"
>     }
> 
> I don't see how it can ever work right when you have the asm output
> above. All procedures in scanasm.exp may have the same problem, which
> can lead false negative and false positive. Should we make procedures
> in scanasm.exp line oriented?

Then .* should be probably replaced with \[^\n\r\]* and \[^w\"\]
with \[^w\"\n\r\].
I'll test it out tomorrow.

	Jakub