scanasm.exp doesn't work too well

[H . J . Lu]

Your patch:

2002-06-10  Jakub Jelinek  <jakub@redhat.com>

	* g++.dg/opt/vt1.C: New test.

causes:

FAIL: g++.dg/opt/vt1.C scan-assembler-not section.*_ZTV1S.*"[^w"]*"

The problem is the asm output is

...
        .section        .gnu.linkonce.d._ZTV1S,"aw",@progbits
...
        .section        .gnu.linkonce.t._ZN1S2vmEv,"ax",@progbits

But scan-assembler-not does

    set fd [open $output_file r]
    set text [read $fd]
    close $fd

    if ![regexp -- "[lindex $args 0]" $text] {
        pass "$testcase scan-assembler-not [lindex $args 0]"
    } else {
        fail "$testcase scan-assembler-not [lindex $args 0]"
        verbose -log "$testcase: $text"
    }

I don't see how it can ever work right when you have the asm output
above. All procedures in scanasm.exp may have the same problem, which
can lead false negative and false positive. Should we make procedures
in scanasm.exp line oriented?


H.J.