[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

[ramana at gcc dot gnu.org]

http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664

--- Comment #9 from Ramana Radhakrishnan <ramana at gcc dot gnu.org> 2012-07-31 16:16:11 UTC ---
(In reply to comment #8)
> For some reason I couldn't apply the patch, but manually changed the tests to
> use { scan-assembler-times regexp 2 } instead of { scan assembler regexp }.

That is interesting . I did create the patch with git diff and just attached it 


> 
> Ramana, have you tried running the tests?  They should pass but don't.  I'll
> take a closer look at what scan-assembler-times and Tcl's regexp are doing.

I wasn't able to run them late last night as I was playing on a machine which
just had ocaml but wasn't set up for testing.

ramana