[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

[janis at gcc dot gnu.org]

http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664

--- Comment #8 from Janis Johnson <janis at gcc dot gnu.org> 2012-07-31 15:56:12 UTC ---
For some reason I couldn't apply the patch, but manually changed the tests to
use { scan-assembler-times regexp 2 } instead of { scan assembler regexp }.

Ramana, have you tried running the tests?  They should pass but don't.  I'll
take a closer look at what scan-assembler-times and Tcl's regexp are doing.