[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
ramrad01 at arm dot com
gcc-bugzilla@gcc.gnu.org
Thu Aug 2 10:11:00 GMT 2012
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #15 from ramrad01 at arm dot com 2012-08-02 10:10:47 UTC ---
On 08/02/12 00:35, janis at gcc dot gnu.org wrote:
> http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
>
> --- Comment #14 from Janis Johnson <janis at gcc dot gnu.org> 2012-08-01 23:35:12 UTC ---
> Ramana, chunks of regular expressions within parentheses are matched and added
> to the returned expression that is used in scan-assembler-times. To avoid
> returning parenthesized bits you need to replace "(regexp)" with "(?:regexp)".
> Here's what works in vst4Qu8.c (cut and pasted, so tabs are wrong):
>
> /* { dg-final { scan-assembler-times "vst4\.8\[
> \]+\\\{(?:(?:\[dD\]\[0-9\]+-\[dD\]\[0-9\]+)|(?:\[dD\]\[0-9\]+, \[dD\]\[0-9\]+,
> \[dD\]\[0-9\]+, \[dD\]\[0-9\]+))\\\},
> \\\[\[rR\]\[0-9\]+\(?::\[0-9\]+\)?\\\]!?\(?:\[ \]+@\[a-zA-Z0-9 \]+\)?\n" 2
> } } */
>
Thanks for digging further. I assume this will work the same regardless
of whether it used in scan-assembler and scan-assembler-times. I'll try
to change the generator later today if you think that to be the case or
muck about with a couple of the vld2Q tests to check if this works there
as well.
Ramana
> I haven't tried modifying the test generator.
>
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