[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

[janis at gcc dot gnu.org]

http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664

--- Comment #14 from Janis Johnson <janis at gcc dot gnu.org> 2012-08-01 23:35:12 UTC ---
Ramana, chunks of regular expressions within parentheses are matched and added
to the returned expression that is used in scan-assembler-times.  To avoid
returning parenthesized bits you need to replace "(regexp)" with "(?:regexp)". 
Here's what works in vst4Qu8.c (cut and pasted, so tabs are wrong):

/* { dg-final { scan-assembler-times "vst4\.8\[        
\]+\\\{(?:(?:\[dD\]\[0-9\]+-\[dD\]\[0-9\]+)|(?:\[dD\]\[0-9\]+, \[dD\]\[0-9\]+,
\[dD\]\[0-9\]+, \[dD\]\[0-9\]+))\\\},
\\\[\[rR\]\[0-9\]+\(?::\[0-9\]+\)?\\\]!?\(?:\[     \]+@\[a-zA-Z0-9 \]+\)?\n" 2
} } */

I haven't tried modifying the test generator.