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Re: Complicated dg test cases
- From: Dan Kegel <dank at kegel dot com>
- To: Janis Johnson <janis187 at us dot ibm dot com>
- Cc: GCC Mailing List <gcc at gcc dot gnu dot org>
- Date: Mon, 09 Feb 2004 03:20:43 -0800
- Subject: Re: Complicated dg test cases
- References: <401D3019.5050800@kegel.com>
Janis Johnson <janis187@us.ibm.com> wrote:
Several months ago, or maybe more than a year ago, I submitted a patch
for the binary compatibility tests in gcc.dg/compat and g++dg/compat to
builds pieces of a test into shared objects and static archives as well
as relocatable object files. It wasn't reviewed and I got sidetracked.
There are lots of problems that could be discovered with tests like
that. ... http://gcc.gnu.org/ml/gcc-patches/2002-10/msg01332.html.
While preparing to try this, I noticed that the existing compat
patches seem to have an undefined exit status. This is bad, isn't it?
Unless I'm confused, we should add a 'return 0;' to the end of g++.dg/compat/*/*_main.C, e.g.
--- gcc-3.3.2/gcc/testsuite/g++.dg/compat/abi/bitfield1_main.C.old Mon Feb 9 03:10:11 2004
+++ gcc-3.3.2/gcc/testsuite/g++.dg/compat/abi/bitfield1_main.C Mon Feb 9 03:10:49 2004
@@ -10,4 +10,5 @@
main ()
{
bitfield1_x ();
+ return 0;
}
I haven't seen these fail because of the missing return, but maybe that's just luck.
- Dan