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[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- From: "janis at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Mon, 30 Jul 2012 18:34:50 +0000
- Subject: [Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- Auto-submitted: auto-generated
- References: <bug-53664-4@http.gcc.gnu.org/bugzilla/>
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #5 from Janis Johnson <janis at gcc dot gnu.org> 2012-07-30 18:34:50 UTC ---
Thanks for looking, Ramana. I noticed in my investigation that the search
string needs to be different for scan-assembler-times than for scan-assembler,
since the regular expression handling seems to be different.