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[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- From: "ramana at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Tue, 31 Jul 2012 00:00:36 +0000
- Subject: [Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- Auto-submitted: auto-generated
- References: <bug-53664-4@http.gcc.gnu.org/bugzilla/>
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #6 from Ramana Radhakrishnan <ramana at gcc dot gnu.org> 2012-07-31 00:00:36 UTC ---
Created attachment 27901
--> http://gcc.gnu.org/bugzilla/attachment.cgi?id=27901
Tentative patch.
Tentative patch - has a few unneeded whitespace changes but probably fixes the
issue. I need to see how this does also with my current changes to the neon
testsuite here but this really should be orthogonal to the other patch.
http://gcc.gnu.org/ml/gcc-patches/2012-07/msg01472.html
Ramana