[Bug debug/101283] Several tests fail on Darwin with -gctf/gbtf

[iains at gcc dot gnu.org]

https://gcc.gnu.org/bugzilla/show_bug.cgi?id=101283

--- Comment #8 from Iain Sandoe <iains at gcc dot gnu.org> ---
we are now left with (where I suspect that the remaining fails are an artefact
of the way in which Darwin represents offsets instead of relocations in DWARF
debug sections):

Running target unix/-m64

Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/btf/btf.exp ...
FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0xa000020[\t
]+[^\n]*btm_offset 1
FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0x700002a[\t
]+[^\n]*btm_offset 1
FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t
]0x13000040[\t ]+[^\n]*btm_offset 1
FAIL: gcc.dg/debug/btf/btf-bitfields-2.c scan-assembler-times [\t
]0x20000020[\t ]+[^\n]*btm_offset 1
FAIL: gcc.dg/debug/btf/btf-bitfields-3.c scan-assembler-times [\t ]0x2[\t
]+[^\n]*btm_type 1
FAIL: gcc.dg/debug/btf/btf-bitfields-4.c scan-assembler-times [\t ]0x4000003[\t
]+[^\n]*btt_info 1
FAIL: gcc.dg/debug/btf/btf-cvr-quals-1.c scan-assembler-times [\t ]0xb000000[\t
]+[^\n]*btt_info 2
Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/ctf/ctf.exp ...
FAIL: gcc.dg/debug/ctf/ctf-attr-mode-1.c scan-assembler-times [\t ]0x3[\t
]+[^\n]*ctv_typeidx 1
FAIL: gcc.dg/debug/ctf/ctf-cvr-quals-1.c scan-assembler-times [\t ]0[\t
]+[^\n]*ctt_name 7
FAIL: gcc.dg/debug/ctf/ctf-cvr-quals-1.c scan-assembler-times [\t
]0x36000000[\t ]+[^\n]*ctt_info 2
Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/debug.exp ...

                === gcc Summary for unix/-m64 ===

# of expected passes            1214
# of unexpected failures        10
# of unsupported tests          24
Running target unix/-m32

Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/btf/btf.exp ...
FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0xa000020[\t
]+[^\n]*btm_offset 1
FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t ]0x700002a[\t
]+[^\n]*btm_offset 1
FAIL: gcc.dg/debug/btf/btf-bitfields-1.c scan-assembler-times [\t
]0x13000040[\t ]+[^\n]*btm_offset 1
FAIL: gcc.dg/debug/btf/btf-bitfields-2.c scan-assembler-times [\t
]0x20000020[\t ]+[^\n]*btm_offset 1
FAIL: gcc.dg/debug/btf/btf-bitfields-3.c scan-assembler-times [\t ]0x2[\t
]+[^\n]*btm_type 1
FAIL: gcc.dg/debug/btf/btf-bitfields-4.c scan-assembler-times [\t ]0x4000003[\t
]+[^\n]*btt_info 1
FAIL: gcc.dg/debug/btf/btf-cvr-quals-1.c scan-assembler-times [\t ]0xb000000[\t
]+[^\n]*btt_info 2
Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/ctf/ctf.exp ...
FAIL: gcc.dg/debug/ctf/ctf-attr-mode-1.c scan-assembler-times [\t ]0x3[\t
]+[^\n]*ctv_typeidx 1
FAIL: gcc.dg/debug/ctf/ctf-cvr-quals-1.c scan-assembler-times [\t ]0[\t
]+[^\n]*ctt_name 7
FAIL: gcc.dg/debug/ctf/ctf-cvr-quals-1.c scan-assembler-times [\t
]0x36000000[\t ]+[^\n]*ctt_info 2
Running /src-local/gcc-master/gcc/testsuite/gcc.dg/debug/debug.exp ...

                === gcc Summary for unix/-m32 ===

# of expected passes            1214
# of unexpected failures        10
# of unsupported tests          24

                === gcc Summary ===

# of expected passes            2428
# of unexpected failures        20
# of unsupported tests          48