[Bug target/67110] gcc.target/i386/iamcu/test_struct_returning.c execution test FAILs with -fpic
hjl at gcc dot gnu.org
gcc-bugzilla@gcc.gnu.org
Tue Aug 4 11:54:00 GMT 2015
https://gcc.gnu.org/bugzilla/show_bug.cgi?id=67110
--- Comment #2 from hjl at gcc dot gnu.org <hjl at gcc dot gnu.org> ---
Author: hjl
Date: Tue Aug 4 11:54:20 2015
New Revision: 226570
URL: https://gcc.gnu.org/viewcvs?rev=226570&root=gcc&view=rev
Log:
Compile IAMCU tests with -fno-pie -no-pie
Since IAMCU tests clear all scratch integer registers with:
asm __volatile__ ("xor %%eax, %%eax\n\t" \
"xor %%edx, %%edx\n\t" \
"xor %%ecx, %%ecx\n\t" \
::: "eax", "edx", "ecx");
PIC register may be trashed between setting PIC register and using it.
This patch compiles AMCU tests with -fno-pie -no-pie.
PR target/67110
* gcc.target/i386/iamcu/abi-iamcu.exp (additional_flags): Add
-fno-pie -no-pie.
Modified:
trunk/gcc/testsuite/ChangeLog
trunk/gcc/testsuite/gcc.target/i386/iamcu/abi-iamcu.exp
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