[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

ramana at gcc dot gnu.org gcc-bugzilla@gcc.gnu.org
Wed Jun 20 15:00:00 GMT 2012


--- Comment #3 from Ramana Radhakrishnan <ramana at gcc dot gnu.org> 2012-06-20 14:59:33 UTC ---
(In reply to comment #2)
> Two scan-assembler directives with the same search string don't look for two
> instances of the same string, they just look for the same thing twice and pass
> if that string only occurs once.  To look for two of them you'd need
> scan-assembler-times, with 2 as the expected number.

Agreed - Aargh .That bit of my post appears to have disappeared. 


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