[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
janis at gcc dot gnu.org
gcc-bugzilla@gcc.gnu.org
Tue Jul 31 17:31:00 GMT 2012
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #11 from Janis Johnson <janis at gcc dot gnu.org> 2012-07-31 17:30:15 UTC ---
Sorry, I had been assuming that the tests in our tree match what's upstream but
the expressions to match are slightly different. I'll keep investigating.
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