[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives

[ramana at gcc dot gnu.org]

http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664

--- Comment #4 from Ramana Radhakrishnan <ramana at gcc dot gnu.org> 2012-07-30 18:30:40 UTC ---


(In reply to comment #0)
> Tests gcc/testsuite/gcc.target/arm/neon/v*.c are generated by the script
> gcc/config/arm/neon-testgen.ml.  54 of these tests have duplicate
> scan-assembler test directives, leading to duplicate lines in the test summary
> file.  The test generator is an O'Caml program.
> 
> I'm hoping that someone who knows that language will kindly take a look at this
> bug, fix it, and regenerate the tests.

I took a quick peek , it's a bit of work to get this done - the problem really
is in the way in which we are generating with emit_epilogue - would be nice if
one could get a hold of VecArray at this point of time and generate
scan-assembler-times the arity .... 

I don't do enough ML to deal with it right now.


Ramana