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[testsuite] XFAIL g++.dg/debug/dwarf2/icf.C on IRIX (PR debug/47393)


As described in the PR, some scan-assembler tests in
g++.dg/debug/dwarf2/icf.C are FAILing on mips-sgi-irix6.5 since
.debug_dcall isn't emitted at all.  On mainline, the failures are gone
since .debug_dcall support has been removed.  Thus there's no point in
trying to fix the bug on the 4.5 and 4.6 branches.

I'm thus XFAILing the respective tests.

Tested with the appropriate runtest invocations on mips-sgi-irix6.5,
installed on 4.5 and 4.6 branches.

	Rainer


2011-07-22  Rainer Orth  <ro@CeBiTec.Uni-Bielefeld.DE>

	PR debug/47393
	* g++.dg/debug/dwarf2/icf.C: XFAIL some scan-assembler on
	mips-sgi-irix*.

Index: gcc/testsuite/g++.dg/debug/dwarf2/icf.C
===================================================================
--- gcc/testsuite/g++.dg/debug/dwarf2/icf.C	(revision 176633)
+++ gcc/testsuite/g++.dg/debug/dwarf2/icf.C	(working copy)
@@ -40,11 +40,11 @@
 
 // Verify that we get .debug_dcall and .debug_vcall tables generated
 // and that we see entries for both virtual calls. 
-// { dg-final { scan-assembler "\\.section.*\.debug_dcall" } }
+// { dg-final { scan-assembler "\\.section.*\.debug_dcall" { xfail mips-sgi-irix* } } }
 // { dg-final { scan-assembler "\\.section.*\.debug_vcall" } }
-// { dg-final { scan-assembler "New caller" } }
-// { dg-final { scan-assembler "Caller DIE offset" } }
+// { dg-final { scan-assembler "New caller" { xfail mips-sgi-irix* } } }
+// { dg-final { scan-assembler "Caller DIE offset" { xfail mips-sgi-irix* } } }
 // { dg-final { scan-assembler "Point of call" } }
-// { dg-final { scan-assembler "Callee DIE offset" } }
+// { dg-final { scan-assembler "Callee DIE offset" { xfail mips-sgi-irix* } } }
 // { dg-final { scan-assembler "0x0.*Vtable slot" } }
 // { dg-final { scan-assembler "0x1.*Vtable slot" } }


-- 
-----------------------------------------------------------------------------
Rainer Orth, Center for Biotechnology, Bielefeld University


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