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r226570 - in /trunk/gcc/testsuite: ChangeLog gc...
- From: hjl at gcc dot gnu dot org
- To: gcc-cvs at gcc dot gnu dot org
- Date: Tue, 04 Aug 2015 11:54:21 -0000
- Subject: r226570 - in /trunk/gcc/testsuite: ChangeLog gc...
Author: hjl
Date: Tue Aug 4 11:54:20 2015
New Revision: 226570
URL: https://gcc.gnu.org/viewcvs?rev=226570&root=gcc&view=rev
Log:
Compile IAMCU tests with -fno-pie -no-pie
Since IAMCU tests clear all scratch integer registers with:
asm __volatile__ ("xor %%eax, %%eax\n\t" \
"xor %%edx, %%edx\n\t" \
"xor %%ecx, %%ecx\n\t" \
::: "eax", "edx", "ecx");
PIC register may be trashed between setting PIC register and using it.
This patch compiles AMCU tests with -fno-pie -no-pie.
PR target/67110
* gcc.target/i386/iamcu/abi-iamcu.exp (additional_flags): Add
-fno-pie -no-pie.
Modified:
trunk/gcc/testsuite/ChangeLog
trunk/gcc/testsuite/gcc.target/i386/iamcu/abi-iamcu.exp