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[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- From: "ramana at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Mon, 30 Jul 2012 18:30:40 +0000
- Subject: [Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- Auto-submitted: auto-generated
- References: <bug-53664-4@http.gcc.gnu.org/bugzilla/>
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #4 from Ramana Radhakrishnan <ramana at gcc dot gnu.org> 2012-07-30 18:30:40 UTC ---
(In reply to comment #0)
> Tests gcc/testsuite/gcc.target/arm/neon/v*.c are generated by the script
> gcc/config/arm/neon-testgen.ml. 54 of these tests have duplicate
> scan-assembler test directives, leading to duplicate lines in the test summary
> file. The test generator is an O'Caml program.
>
> I'm hoping that someone who knows that language will kindly take a look at this
> bug, fix it, and regenerate the tests.
I took a quick peek , it's a bit of work to get this done - the problem really
is in the way in which we are generating with emit_epilogue - would be nice if
one could get a hold of VecArray at this point of time and generate
scan-assembler-times the arity ....
I don't do enough ML to deal with it right now.
Ramana