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[google gcc-4_8] increase builtin_expect probability in loop exit test

From: Rong Xu <xur at google dot com>
To: GCC Patches <gcc-patches at gcc dot gnu dot org>
Cc: David Li <davidxl at google dot com>, Jan Hubicka <hubicka at ucw dot cz>
Date: Fri, 11 Oct 2013 14:10:47 -0700
Subject: [google gcc-4_8] increase builtin_expect probability in loop exit test
Authentication-results: sourceware.org; auth=none

The trunk version of this patch is submitted for review.

David: can we have this patch for google/gcc-4_8 branch first?
It tested with regression and google internal benchmarks.

Thanks,

-Rong

Attachment: patch.txt
Description: Text document

Follow-Ups:
- Re: [google gcc-4_8] increase builtin_expect probability in loop exit test
  - From: Xinliang David Li

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