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Re: [PATCH, testsuite] Print pattern for scan-assembler-times like scan-assembler
- From: Janis Johnson <janis187 at us dot ibm dot com>
- To: Adam Nemet <anemet at caviumnetworks dot com>
- Cc: gcc-patches at gcc dot gnu dot org
- Date: Thu, 24 Sep 2009 11:08:50 -0700
- Subject: Re: [PATCH, testsuite] Print pattern for scan-assembler-times like scan-assembler
- References: <19128.25785.510245.749935@ropi.home>
- Reply-to: janis187 at us dot ibm dot com
On Mon, 2009-09-21 at 22:46 -0700, Adam Nemet wrote:
> For scan-assembler-times and some other asm-scanning functions the pattern is
> printed unescaped in the full test name. This causes strange multi-line
> entries in the summary file. Note that the two main functions scan-assembler
> and scan-assembler-not don't suffer from this problem. The patch fixes the
> other ones. E.g.:
>
> -PASS: g++.dg/debug/dwarf2/imported-decl-1.C scan-assembler-times var2[^
> -]*DW_AT_name 1
> +PASS: g++.dg/debug/dwarf2/imported-decl-1.C scan-assembler-times var2[^\n\r]*DW_AT_name 1
>
> Tested on x86_64-linux-gnu. Also tested mips.exp for mips64octeon-linux-gnu.
>
> OK to install?
>
> Adam
>
>
> * lib/scanasm.exp (make_pattern_printable): New function.
> (dg-scan, scan-assembler-times, scan-assembler-dem,
> scan-assembler-dem-not): Use it.
OK.
Janis