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PATCH: PR testsuite/32062: A MASK is non-efficient in certain sse4_1 tests
- From: "H. J. Lu" <hjl at lucon dot org>
- To: Uros Bizjak <ubizjak at gmail dot com>
- Cc: gcc-patches at gcc dot gnu dot org
- Date: Thu, 24 May 2007 07:11:01 -0700
- Subject: PATCH: PR testsuite/32062: A MASK is non-efficient in certain sse4_1 tests
- References: <5787cf470705240015r78feb5e4xb0e4670ad9a8a915@mail.gmail.com>
On Thu, May 24, 2007 at 09:15:29AM +0200, Uros Bizjak wrote:
> Hello!
>
> There is a test "problem" with sse4_1-blendpd.c and sse4_1-blendps.c
> [1]. The MASK of 0x03 or 0x0f is non-efficient to test blendpd and
> blendps instruction. gcc will figure out that this insn can be
> substituted with simple move and won't generate expected insn.
>
> The solution is to change MASK to 0x02 for blendpd and some
> appropriate value for blendps. Could you fix this issue?
>
> [1]: http://gcc.gnu.org/bugzilla/show_bug.cgi?id=32062
I was compiling SSE4.1 testsuite with -DMASK=0x2 and did generate
SSE4.1 instructions for all SSE4.1 testcases. I am checking in this
patch as an obvious fix. Tested on Linux/Intel64.
H.J.
---
2007-05-24 H.J. Lu <hongjiu.lu@intel.com>
PR testsuite/32062
* gcc.target/i386/sse4_1-check.h (MASK): New.
--- gcc/testsuite/gcc.target/i386/sse4_1-check.h.mask 2007-05-23 09:42:16.000000000 -0700
+++ gcc/testsuite/gcc.target/i386/sse4_1-check.h 2007-05-24 07:09:19.000000000 -0700
@@ -4,6 +4,8 @@
static void sse4_1_test (void);
+#define MASK 0x2
+
int
main ()
{