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[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- From: "janis at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Tue, 31 Jul 2012 18:01:55 +0000
- Subject: [Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- Auto-submitted: auto-generated
- References: <bug-53664-4@http.gcc.gnu.org/bugzilla/>
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #13 from Janis Johnson <janis at gcc dot gnu.org> 2012-07-31 18:01:55 UTC ---
The scan-assembler finds the expression at least once and passes. The
scan-assembler-times directive expects to find the expression twice, but the
returned match is 5 lines, not 2. I'm building a version whose tests match
those upstream and will report what's happening there. I'm not set up to run
neon tests with an upstream tree.