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[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- From: "janis at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Tue, 31 Jul 2012 16:49:23 +0000
- Subject: [Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- Auto-submitted: auto-generated
- References: <bug-53664-4@http.gcc.gnu.org/bugzilla/>
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #10 from Janis Johnson <janis at gcc dot gnu.org> 2012-07-31 16:49:23 UTC ---
The problem is the regular expression, which matches far too much text and ends
up with a length of 5 instead of 2.