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[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- From: "janis at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Tue, 31 Jul 2012 15:56:12 +0000
- Subject: [Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- Auto-submitted: auto-generated
- References: <bug-53664-4@http.gcc.gnu.org/bugzilla/>
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #8 from Janis Johnson <janis at gcc dot gnu.org> 2012-07-31 15:56:12 UTC ---
For some reason I couldn't apply the patch, but manually changed the tests to
use { scan-assembler-times regexp 2 } instead of { scan assembler regexp }.
Ramana, have you tried running the tests? They should pass but don't. I'll
take a closer look at what scan-assembler-times and Tcl's regexp are doing.