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[Bug testsuite/52665] New: scan-assembler output produces wrong FAIL due to matching .ident
- From: "aldot at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Thu, 22 Mar 2012 11:59:13 +0000
- Subject: [Bug testsuite/52665] New: scan-assembler output produces wrong FAIL due to matching .ident
- Auto-submitted: auto-generated
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=52665
Bug #: 52665
Summary: scan-assembler output produces wrong FAIL due to
matching .ident
Classification: Unclassified
Product: gcc
Version: 4.8.0
Status: UNCONFIRMED
Severity: normal
Priority: P3
Component: testsuite
AssignedTo: unassigned@gcc.gnu.org
ReportedBy: aldot@gcc.gnu.org
I see this regression:
FAIL: gcc.target/i386/pr28946.c scan-assembler-not test
The culprit is the testsuite errnoeously matching my local branch name in the
assembler output's .ident.
$ grep scan ../../src/gcc-4.8/gcc/testsuite/gcc.target/i386/pr28946.c
/* { dg-final { scan-assembler-not "test" } } */
$ ./gcc/xgcc -B/scratch/obj.x86_64/gcc-4.8/gcc/
../../src/gcc-4.8/gcc/testsuite/gcc.target/i386/pr28946.c -Os
-ffat-lto-objects -S -o - | grep test
.ident "GCC: (GNU) 4.8.0 20120320 (experimental) [fixups-testsuite
revision 1dc2c94:40d1377:d28ff051e43bdf8f8aab692fbf6932a7211ca49d]"
Perhaps output for scan-assembler should be built with -fno-ident ?