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[Bug testsuite/49323] New: FAIL: g++.dg/debug/dwarf2/integer-typedef.C scan-assembler-times *


http://gcc.gnu.org/bugzilla/show_bug.cgi?id=49323

           Summary: FAIL: g++.dg/debug/dwarf2/integer-typedef.C
                    scan-assembler-times *
           Product: gcc
           Version: 4.7.0
            Status: UNCONFIRMED
          Severity: normal
          Priority: P3
         Component: testsuite
        AssignedTo: unassigned@gcc.gnu.org
        ReportedBy: dominiq@lps.ens.fr
                CC: jakub@gcc.gnu.org, danglin@gcc.gnu.org,
                    ro@gcc.gnu.org, dodji@gcc.gnu.org


On x86_64-apple-darwin10 at revision 174779
g++.dg/debug/dwarf2/integer-typedef.C fails with

FAIL: g++.dg/debug/dwarf2/integer-typedef.C scan-assembler-times
[^\\n\\r]*DW_AT_name: "S<2048ul>" 1
FAIL: g++.dg/debug/dwarf2/integer-typedef.C scan-assembler-times
[^\\n\\r]*DW_AT_MIPS_linkage_name: "_ZN1SILm2048EE1fEm" 1

for both -m32 and -m64. Grepping the assembler I see

    .ascii "S<2048ul>\0"    # DW_AT_name

and

    .ascii "_ZN1SILm2048EE1fEm\0"    # DW_AT_MIPS_linkage_name
    .byte    0x87,0x40    # uleb128 0x2007; (DW_AT_MIPS_linkage_name)

The test has been introduced by revision 174742 and the failures are along the
line of pr49288.


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