This is the mail archive of the
gcc-bugs@gcc.gnu.org
mailing list for the GCC project.
[Bug c/33111] Bad code generation with -O2 (ARM 7 architecture)
- From: "gressau at optusnet dot com dot au" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: 9 Sep 2007 20:44:27 -0000
- Subject: [Bug c/33111] Bad code generation with -O2 (ARM 7 architecture)
- References: <bug-33111-14993@http.gcc.gnu.org/bugzilla/>
- Reply-to: gcc-bugzilla at gcc dot gnu dot org
------- Comment #6 from gressau at optusnet dot com dot au 2007-09-09 20:44 -------
Created an attachment (id=14180)
--> (http://gcc.gnu.org/bugzilla/attachment.cgi?id=14180&action=view)
Test of optimized comparison (-O2)
Comparison of four consecutive bytes gets optimized (-O2) as comparison of a
word. The word address produced does not have the last two bits zero and the
ARM7 processor either ignores them (LPC2000) or data aborts (SAM7).
--
gressau at optusnet dot com dot au changed:
What |Removed |Added
----------------------------------------------------------------------------
Attachment #14077|0 |1
is obsolete| |
Attachment #14078|0 |1
is obsolete| |
Attachment #14079|0 |1
is obsolete| |
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=33111