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scanasm.exp doesn't work too well
- From: "H . J . Lu" <hjl at lucon dot org>
- To: jakub at redhat dot com
- Cc: gcc at gcc dot gnu dot org
- Date: Thu, 13 Jun 2002 12:55:19 -0700
- Subject: scanasm.exp doesn't work too well
Your patch:
2002-06-10 Jakub Jelinek <jakub@redhat.com>
* g++.dg/opt/vt1.C: New test.
causes:
FAIL: g++.dg/opt/vt1.C scan-assembler-not section.*_ZTV1S.*"[^w"]*"
The problem is the asm output is
...
.section .gnu.linkonce.d._ZTV1S,"aw",@progbits
...
.section .gnu.linkonce.t._ZN1S2vmEv,"ax",@progbits
But scan-assembler-not does
set fd [open $output_file r]
set text [read $fd]
close $fd
if ![regexp -- "[lindex $args 0]" $text] {
pass "$testcase scan-assembler-not [lindex $args 0]"
} else {
fail "$testcase scan-assembler-not [lindex $args 0]"
verbose -log "$testcase: $text"
}
I don't see how it can ever work right when you have the asm output
above. All procedures in scanasm.exp may have the same problem, which
can lead false negative and false positive. Should we make procedures
in scanasm.exp line oriented?
H.J.