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Re: [PATCH][ARM] Fix test pr82989.c for big endian and mthumb
- From: Christophe Lyon <christophe dot lyon at linaro dot org>
- To: Sudakshina Das <sudi dot das at arm dot com>
- Cc: "gcc-patches at gcc dot gnu dot org" <gcc-patches at gcc dot gnu dot org>, nd <nd at arm dot com>, Kyrill Tkachov <kyrylo dot tkachov at foss dot arm dot com>, Richard Earnshaw <Richard dot Earnshaw at arm dot com>, Ramana Radhakrishnan <Ramana dot Radhakrishnan at arm dot com>
- Date: Wed, 21 Mar 2018 17:33:24 +0100
- Subject: Re: [PATCH][ARM] Fix test pr82989.c for big endian and mthumb
- References: <4bdd2e5b-992b-7c35-3d2e-20c3bf9c0e23@arm.com>
On 21 March 2018 at 13:11, Sudakshina Das <sudi.das@arm.com> wrote:
> Hi
>
> The test pr82989.c which was added in one of previous commits is failing
> for mthumb and big-endian configurations. The aim of this test was to
> check that NEON instructions are not being used for simple shift
> operations. The scanning of lsl and lsr instructions and checking its
> counts were just too restrictive for different configurations. So I
> have now simplified the test to only check for the absence of NEON
> instructions.
>
> Testing: Only test case change so only tested the said test on
> differently configured toolchain.
> @Christophe can you confirm this patch fixes the failure for you?
>
Yes, the validations are now OK my side.
Thanks
Christophe
> Thanks
> Sudi
>
> *** gcc/testsuite/ChangeLog ***
>
> 2018-03-21 Sudakshina Das <sudi.das@arm.com>
>
> PR target/82989
> * gcc.target/arm/pr82989.c: Change dg-scan-assembly directives.