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[GCC][PATCH][ARM][Committed] Fix FP16 test assembler scans

From: Tamar Christina <Tamar dot Christina at arm dot com>
To: gcc-patches <gcc-patches at gcc dot gnu dot org>
Cc: nd <nd at arm dot com>, Kyrill Tkachov <kyrylo dot tkachov at foss dot arm dot com>, "Ramana Radhakrishnan" <Ramana dot Radhakrishnan at arm dot com>, Richard Earnshaw <Richard dot Earnshaw at arm dot com>
Date: Tue, 16 May 2017 16:00:59 +0000
Subject: [GCC][PATCH][ARM][Committed] Fix FP16 test assembler scans
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Hi All,

This fixes two assembler scan tests for ARM.
The typo in the test made it fail if anything
but d0 is used.

Committed as r 248117 under the GCC obvious rule.

gcc/testsuite/
2017-05-16  Tamar Christina  <tamar.christina@arm.com>

	* gcc.target/arm/armv8_2-fp16-neon-1.c (vceqz): Fix regex.
	* gcc.target/arm/armv8_2-fp16-neon-2.c (vceqz): Fix regex.

Thanks,
Tamar

Attachment: fast-math-fp16-tests.patch
Description: fast-math-fp16-tests.patch

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