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> From: Richard Earnshaw > This rule > > + /* { dg-final { scan-assembler "and\tw\[0-9\]+, w\[0-9\]+, w\[0- > 9\]+" } } */ > > Will match anything that this rule > > > + /* { dg-final { scan-assembler "and\tw\[0-9\]+, w\[0-9\]+, w\[0- > 9\]+, lsl 3" } } */ > > matches (though not vice versa). > > Similarly for the x register variants. > Thanks for the review. I've fixed this up in the attached patch, by counting the number of matches for the first rule and expecting it to match additional times to cover the overlap with the lsl based rule. I've also renamed the testcases in line with the suggested GCC testcase naming convention. OK for commit? Cheers, Ian 2013-05-01 Ian Bolton <ian.bolton@arm.com> * gcc.target/aarch64/ands_1.c: New test. * gcc.target/aarch64/ands_2.c: Likewise
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aarch64-ands-tests-svn-patch-v4.txt
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