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Re: [Patch ARM testsuite] fix 3 tests for big-endian
- From: Janis Johnson <janis_johnson at mentor dot com>
- To: Christophe Lyon <christophe dot lyon at linaro dot org>
- Cc: <gcc-patches at gcc dot gnu dot org>
- Date: Fri, 31 Aug 2012 09:14:37 -0700
- Subject: Re: [Patch ARM testsuite] fix 3 tests for big-endian
- References: <CAKdteOZG8mtqEZh25FR_yemAixP-zi6gk3e7GxrbnNrd0bXaWg@mail.gmail.com>
- Reply-to: <janisjo at codesourcery dot com>
On 08/31/2012 05:05 AM, Christophe Lyon wrote:
> Hi,
>
> Tests gcc.target/arm/pr48252.c, gcc.target/arm/pr51835.c and
> gcc.target/arm/neon-vset_lanes8.c currently expect little-endian code
> and fail when compiled/executed in big-endian mode.
>
> The attached patch fixes them.
>
> Tested with qemu on armeb-none-linux-gnueabi and arm-none-linux-gnueabi.
>
> OK?
I'll let an ARM expert review the patch, but please don't use TCL
code in test directives. Instead of
+/* { dg-final { if [check_effective_target_arm_little_endian] \{ } } */
/* { dg-final { scan-assembler-times "fmrrd\[\\t \]+r0,\[\\t \]*r1,\[\\t \]*d0" 2 } } */
+/* { dg-final { \} else \{ } } */
+/* { dg-final { scan-assembler-times "fmrrd\[\\t \]+r1,\[\\t \]*r0,\[\\t \]*d0" 2 } } */
+/* { dg-final { \}
do something like
/* { dg-final { scan-assembler-times "fmrrd\[\\t \]+r0,\[\\t \]*r1,\[\\t \]*d0" 2 } { target arm_little_endian } } */
/* { dg-final { scan-assembler-times "fmrrd\[\\t \]+r1,\[\\t \]*r0,\[\\t \]*d0" 2 } {target { ! arm_little_endian } } } */
That's untested, but you get the idea.
Janis