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Re: [Patch ARM testsuite] fix 3 tests for big-endian


On 08/31/2012 05:05 AM, Christophe Lyon wrote:
> Hi,
> 
> Tests gcc.target/arm/pr48252.c, gcc.target/arm/pr51835.c  and
> gcc.target/arm/neon-vset_lanes8.c currently expect little-endian code
> and fail when compiled/executed in big-endian mode.
> 
> The attached patch fixes them.
> 
> Tested with qemu on armeb-none-linux-gnueabi and arm-none-linux-gnueabi.
> 
> OK?

I'll let an ARM expert review the patch, but please don't use TCL
code in test directives.  Instead of

+/* { dg-final { if [check_effective_target_arm_little_endian] \{         } } */
 /* { dg-final { scan-assembler-times "fmrrd\[\\t \]+r0,\[\\t \]*r1,\[\\t \]*d0" 2 } } */
+/* { dg-final { \}   else \{                                             } } */
+/* { dg-final {    scan-assembler-times "fmrrd\[\\t \]+r1,\[\\t \]*r0,\[\\t \]*d0" 2  } } */
+/* { dg-final { \}                                        

do something like

/* { dg-final { scan-assembler-times "fmrrd\[\\t \]+r0,\[\\t \]*r1,\[\\t \]*d0" 2 } { target arm_little_endian } } */
/* { dg-final { scan-assembler-times "fmrrd\[\\t \]+r1,\[\\t \]*r0,\[\\t \]*d0" 2  } {target { ! arm_little_endian } } } */

That's untested, but you get the idea.

Janis



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