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[Bug tree-optimization/56717] Enhance Dot-product pattern recognition to avoid mult widening.
- From: "congh at google dot com" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Fri, 08 Nov 2013 19:44:07 +0000
- Subject: [Bug tree-optimization/56717] Enhance Dot-product pattern recognition to avoid mult widening.
- Auto-submitted: auto-generated
- References: <bug-56717-4 at http dot gcc dot gnu dot org/bugzilla/>
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=56717
Cong Hou <congh at google dot com> changed:
What |Removed |Added
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CC| |congh at google dot com
--- Comment #1 from Cong Hou <congh at google dot com> ---
The way ICC uses is not related to dot-product. It just finds out a smart way
to implement widen-mult (s16 to s32) using PMADDWD.
I will try to make a patch on this issue.
thanks,
Cong