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[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- From: "ramana at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Tue, 31 Jul 2012 16:16:11 +0000
- Subject: [Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- Auto-submitted: auto-generated
- References: <bug-53664-4@http.gcc.gnu.org/bugzilla/>
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #9 from Ramana Radhakrishnan <ramana at gcc dot gnu.org> 2012-07-31 16:16:11 UTC ---
(In reply to comment #8)
> For some reason I couldn't apply the patch, but manually changed the tests to
> use { scan-assembler-times regexp 2 } instead of { scan assembler regexp }.
That is interesting . I did create the patch with git diff and just attached it
>
> Ramana, have you tried running the tests? They should pass but don't. I'll
> take a closer look at what scan-assembler-times and Tcl's regexp are doing.
I wasn't able to run them late last night as I was playing on a machine which
just had ocaml but wasn't set up for testing.
ramana