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[Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- From: "ramana at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Tue, 31 Jul 2012 00:04:58 +0000
- Subject: [Bug testsuite/53664] neon-testgen.ml generates duplicate scan-assembler directives
- Auto-submitted: auto-generated
- References: <bug-53664-4@http.gcc.gnu.org/bugzilla/>
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53664
--- Comment #7 from Ramana Radhakrishnan <ramana at gcc dot gnu.org> 2012-07-31 00:04:58 UTC ---
(In reply to comment #5)
> Thanks for looking, Ramana. I noticed in my investigation that the search
> string needs to be different for scan-assembler-times than for scan-assembler,
> since the regular expression handling seems to be different.
Could you take a look at the output of the tentative-patch I've attached here ?
I'll clean it up and submit it properly sometime tomorrow.
Ramana