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[Bug testsuite/53665] New: test g++.dg/abi/mangle50.C has duplicate scan-assembler lines
- From: "janis at gcc dot gnu.org" <gcc-bugzilla at gcc dot gnu dot org>
- To: gcc-bugs at gcc dot gnu dot org
- Date: Thu, 14 Jun 2012 01:18:23 +0000
- Subject: [Bug testsuite/53665] New: test g++.dg/abi/mangle50.C has duplicate scan-assembler lines
- Auto-submitted: auto-generated
http://gcc.gnu.org/bugzilla/show_bug.cgi?id=53665
Bug #: 53665
Summary: test g++.dg/abi/mangle50.C has duplicate
scan-assembler lines
Classification: Unclassified
Product: gcc
Version: 4.7.1
Status: UNCONFIRMED
Severity: normal
Priority: P3
Component: testsuite
AssignedTo: unassigned@gcc.gnu.org
ReportedBy: janis@gcc.gnu.org
CC: jason@gcc.gnu.org
Test g++.dg/abi/mangle50.C has three dg-final test directives with
scan-assembler checks, two of which are identical. The third one is probably
supposed to be for function h, but instead of guessing what it should be I'll
let someone who understands the issue figure it out.